metallurgical microscope BX41M-LEDThe Olympus anti-static metallographic microscope BX41M-LED uses a long-life LED illumination on the anti-static and corresponding ESD microscope. There are two types of reflective lighting devices available: conventional and oblique lighting. The oblique lighting operation is simple and can obtain high c…[Detailed] |
metallurgical microscope BX51The Olympus BX51 is a scientific grade upright metallographic microscope that covers all observation methods. Equipped with advanced UIS 2 optical system, providing superior optical image quality, the wide field of view PLAPON objective combined with the achromatic and spherical aberration focusing lens U…[Detailed] |
metallurgical microscope BX51MThe Olympus BX51M is a scientific grade upright metallographic microscope that covers all observation methods. Equipped with advanced UIS 2 optical system, providing superior optical image quality, the wide field of view PLAPON objective combined with the achromatic and spherical aberration focusing lens …[Detailed] |
metallurgical microscope MX51The Olympus MX51 Industrial Inspection Microscope is a cost-effective microscope that considers the design of inspection efficiency, vivid images, and excellent resolution software solutions, helping to achieve attachments for various observation methods, suitable for the observation needs of various elec…[Detailed] |
metallurgical microscope BX51M-IRThe BX51IR microscope can perform non-destructive examination and analysis on areas that are not visible to the naked eye, as well as a specialized microscope for near-infrared observation. Able to perform non-destructive CPS bumping observations on the interior of semiconductor chips and the back of inte…[Detailed] |
High definition transparent reflection metallographic m…This three lens reflective metallographic microscope is suitable for small and inconvenient inverted samples, as well as for observation, research, and analysis of specific range target samples. The transparent and reflective metallographic microscope is equipped with a falling beam illuminator (coaxial r…[Detailed] |
Metallographic inspection microscope HN-MXDMainly used for semiconductor wafer detection, liquid crystal screen (LCD) detection, conductive particle inspection, laboratory material analysis, and other precision engineering detection research. It can perform bright field, dark field, differential interference, and polarization observation on sample…[Detailed] |
Large platform upright metallographic microscopeThe HN-201 series upright metallographic microscope is suitable for microscopic observation of opaque objects. Equipped with a mechanical loading platform with a large range of movement, a falling beam illuminator, and a built-in polarization observation device, it has the characteristics of clear images,…[Detailed] |
Large platform upright metallographic microscopeThe HN-101 series upright metallographic microscope is suitable for microscopic observation of opaque objects. Equipped with a mechanical loading platform with a large range of movement, a falling beam illuminator, and a built-in polarization observation device, it has the characteristics of clear images,…[Detailed] |
Transreflective metallographic microscopeThe HN-3030 transmission and reflection microscope is suitable for microscopic observation of opaque or transparent objects. This instrument is equipped with a shooting and transmission lighting system, a long-range flat field achromatic objective (without a cover glass), a large field eyepiece, and a bui…[Detailed] |
Upright metallographic microscopeThe HN-3003 upright metallographic microscope is suitable for microscopic observation of opaque objects. This instrument is equipped with a falling beam illuminator, a long-range flat field achromatic objective (without a cover glass), a large field of view eyepiece, and a built-in polarizing observation …[Detailed] |
Transreflective upright metallographic microscopeThe HN-2030 series transparent and reflective upright metallographic microscope is suitable for microscopic observation of opaque or transparent objects. This instrument is equipped with a shooting and transmission lighting system, a long-range flat field achromatic objective (without a cover glass), a la…[Detailed] |
