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Metallographic microscope BX51M-IRThe BX51IR microscope can perform non-destructive examination and analysis on areas that are not visible to the naked eye, as well as a specialized microscope for near-infrared observation. Able to perform non-destructive CPS bumping observations on the interior of semiconductor chips and the back of inte…[Detailed] |
Metallographic microscope BX51MThe Olympus BX51M is a scientific grade upright metallographic microscope that covers all observation methods. Equipped with advanced UIS 2 optical system, providing superior optical image quality, the wide field of view PLAPON objective combined with the achromatic and spherical aberration focusing lens …[Detailed] |
Metallographic microscope BX61Metallographic microscope[Detailed] |
Metallographic microscopeBrand: Olympus/Olympus Model: BXFM-S Weight: 6.2 (kg) Specification: 394 * 334 * 276mm[Detailed] |
Metallographic microscopeThe characteristics of the OLYMPUS MX61/61L product are to shorten inspection time and improve inspection efficiency. The automatic focusing accessory MX-AF transmission light inspection lighting MX-TILLA/MX-TILLBMX is a dedicated automatic focusing accessory that can be used with all reflection light ill…[Detailed] |
